Why we believe in Correlative Microscopy
Combining different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information.
Here at Quantum Design Microscopy we combine two of the most powerful microscopy methods – scanning electron microscopy (SEM) and atomic force microscopy (AFM) – in order to gain completely new insights into the micro- and nano-world using correlative microscopy.
Especially the capability to integrate the AFM system directly inside the high-vacuum environment of the SEM enables a completely new way to perform your research and your experiments.
It allows to directly combine the complimentary strengths of both techniques in-situ without the need to transfer your sample or to break vacuum.
The possibility to work simultaneously with SEM and AFM offers the great advantage that – in in addition to simply measure the 3D topography – you can also work with the advanced AFM modes, in order to measure, e.g., mechanical, magnetic, or conductive properties.
This enables completely new possibilities for true correlative microscopy and allows you to extract unique information from your sample.
Correlative Microscopy in Action
Latest News
2020, May 20: Quantum Design and Angstrom Scientific Webinar
Register for our webinar on characterization of conductive and magnetic nanostructures by correlative in-situ AFM and SEM via the link below! Register now....
2020, April: New AFSEM Publication: Nanostructuring of Copper Surface
Make sure to check out the latest AFSEM paper! Its topic is coloration of a copper surface by nanostructuring with femtosecond laser pulses. The AFM measurements were performed with the AFSEM at USTEM in Vienna. Read more...
2020, April: New AFSEM Paper: Correlative AFM and HIM
Have you read the latest AFSEM paper? It tells you all about how our AFSEM was integrated into a Helium Ion Microscopy and which interesting experiment was made possible by this unique setup. Read more...
Coming Soon: The Brand New AFSEM®nano System
We are more than proud to announce that after many years of intense product development and research we will be introducing the new AFSEM®nano. Through our close relations with the current AFSEM users, we have been able to develope a scanner and stage which perfectly fits the needs of everyday users, whilst still delivering the high quality measurements you are [...]
AFSEM® users about our product…
“Constantly, applications and challenges arise for which the AFSEM is not only practical, but essential. That starts with direct correlation of specific particles or structures and ends with vacuum conditions as prerequisite, such as thermal measurements. Furthermore, the AFSEM accelerates the work-flow and therefore increases the efficiency for many studies.”
“The high spatial resolution of AFSEM, especially in Z direction, strongly stretched the application of our SEM. Combined with the high angle resolution of EBSD, the AFSEM becomes a powerful tool for the research of phase transformation.”
“What was really convincing to us is the huge versatility of this combination of an Atomic Force Microscope with our excellent optical microscope for our challenging materials and problems. We simply can use real life specimen without big preparation.”
“AFSEM® not only extends the resolution of our microscopes by an order of magnitude, it extends our measurement capabilities beyond topography concerning material composition.”
“Thanks to the AFSEM we can now perform in situ investigations in our FIB microscope, which were not possible before. Especially the possibility to immediately control the result of your nanofabrication experiment is a real benefit!”