Why we believe in Correlative Microscopy
Combining different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information.
Here at Quantum Design Microscopy we combine two of the most powerful microscopy methods – scanning electron microscopy (SEM) and atomic force microscopy (AFM) – in order to gain completely new insights into the micro- and nano-world using correlative microscopy.
Especially the capability to integrate the AFM system directly inside the high-vacuum environment of the SEM enables a completely new way to perform your research and your experiments.
It allows to directly combine the complimentary strengths of both techniques in-situ without the need to transfer your sample or to break vacuum.
The possibility to work simultaneously with SEM and AFM offers the great advantage that – in in addition to simply measure the 3D topography – you can also work with the advanced AFM modes, in order to measure, e.g., mechanical, magnetic, or conductive properties.
This enables completely new possibilities for true correlative microscopy and allows you to extract unique information from your sample.
Correlative Microscopy in Action
Latest News
QDM Visit at FELMI TU Graz
Last week, we visited our partners and customers at FELMI-ZFE Institut TU Graz. We made sure that their AFSEM was still delivering high quality results and supported them with the development of new measurement setups. We cannot wait to see their future research using Correlative Microscopy!
2021, September: AFSEM nano at Stanford University
We are more than thrilled to announce that we installed an AFSEM at Stanford University After the installation by our colleagues at Quantum Design, the AFSEM can now be used in combination with the Thermo Fisher Scientific Teneo SEM and the Kleindiek Nanotechnik nanomanipulator shuttle stage at the group of Fritz Prinz. We cannot wait to see the unique measurements [...]
2021, August: Microscopy and Microanalysis Virtual Meeting 2021
Learn more about the AFSEM at this year's M&M virtual meeting, which takes place from the 1st until the 5th of August. On the 3rd at 12:30 PM Christian Schwalb will be giving a talk at talking all about magnetic and conductive measurements using the AFSEM. You can also meet us at the Quantum Design virtual booth. We would love [...]
2021, May: 11th ASEM workshop
Learn more about the AFSEM at the 11th ASEM workshop! Together with our partner GETec Microscopy we will be giving a talk all about the benefits of Correlative Microscopy with a special focus on magnetic and conductive measurement modes. Learn more!
AFSEM® users about our product…
“Constantly, applications and challenges arise for which the AFSEM is not only practical, but essential. That starts with direct correlation of specific particles or structures and ends with vacuum conditions as prerequisite, such as thermal measurements. Furthermore, the AFSEM accelerates the work-flow and therefore increases the efficiency for many studies.”
“The high spatial resolution of AFSEM, especially in Z direction, strongly stretched the application of our SEM. Combined with the high angle resolution of EBSD, the AFSEM becomes a powerful tool for the research of phase transformation.”
“What was really convincing to us is the huge versatility of this combination of an Atomic Force Microscope with our excellent optical microscope for our challenging materials and problems. We simply can use real life specimen without big preparation.”
“AFSEM® not only extends the resolution of our microscopes by an order of magnitude, it extends our measurement capabilities beyond topography concerning material composition.”
“Thanks to the AFSEM we can now perform in situ investigations in our FIB microscope, which were not possible before. Especially the possibility to immediately control the result of your nanofabrication experiment is a real benefit!”